Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
Real objects present an enormous amount of detail, including aging effects. Artists need an intuitive control when they iteratively review and redesign their work to achieve a spe...