171 search results - page 8 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
ITC
1996
IEEE
14 years 1 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
VLSID
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ITC
2000
IEEE
14 years 19 days ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ICCAD
2002
IEEE
14 years 6 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
AFRIGRAPH
2007
ACM
14 years 1 months ago
2007
ACM
Real objects present an enormous amount of detail, including aging effects. Artists need an intuitive control when they iteratively review and redesign their work to achieve a spe...