9 search results - page 1 / 2 » System issues in boundary-scan board test |
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...
AIMSA
2008
Springer
14 years 1 months ago
2008
Springer
In order to build an intelligent system that allows human beings to cooperate with a computing machine to perform a given task it is important to account for the individual charact...
MSE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper describes the authors experience with teaching VHDL (and more recently, Verilog) to undergraduate and graduate students at WPI and to engineers through various short co...