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DATE
2003
IEEE
96views Hardware» more  DATE 2003»
14 years 25 days ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
CASES
2003
ACM
14 years 24 days ago
Power efficient encoding techniques for off-chip data buses
Reducing the power consumption of computing devices has gained a lot of attention recently. Many research works have focused on reducing power consumption in the off-chip buses as...
Dinesh C. Suresh, Banit Agrawal, Jun Yang 0002, Wa...
CIKM
2010
Springer
13 years 6 months ago
Yes we can: simplex volume maximization for descriptive web-scale matrix factorization
Matrix factorization methods are among the most common techniques for detecting latent components in data. Popular examples include the Singular Value Decomposition or Nonnegative...
Christian Thurau, Kristian Kersting, Christian Bau...
ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 1 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
VISUALIZATION
1998
IEEE
13 years 11 months ago
Hierarchical volume analysis and visualization based on morphological operators
One common problem in the practical application of volume visualization is the proper choice of transfer functions in order to color different parts of the volume meaningfully. Th...
Christoph Lürig, Thomas Ertl