249 search results - page 25 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
DAGSTUHL
2001
13 years 9 months ago
2001
Visualization of an algorithm offers only a rough picture of operations. Explanations are crucial for deeper understanding, because they help the viewer to associate the visualiza...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
This paper proposes a statistical mechanism to analyze the detector coverage in a negative selection algorithm, namely a quantitative measurement of a detector set’s capability ...
ICCAD
1999
IEEE
13 years 12 months ago
1999
IEEE
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....