203 search results - page 38 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DATE
2003
IEEE
14 years 22 days ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
CISS
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—Fault detection plays an indispensable role in ensuring the security of smart grid systems. Based on the dynamics of the generators, we show the time evolution of the sm...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
ICCAD
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...