14 search results - page 1 / 3 » Test Wrapper and Test Access Mechanism Co-Optimization for S... |
146
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ET
2002
15 years 4 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
151
Voted
DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
155
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DATE
2002
IEEE
15 years 10 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
128
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VTS
2002
IEEE
15 years 10 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
120
Voted
ETS
2006
IEEE
15 years 11 months ago
2006
IEEE
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...