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SOFSEM
2012
Springer
14 years 1 months ago
Randomized Group Testing Both Query-Optimal and Minimal Adaptive
The classical group testing problem asks to determine at most d defective elements in a set of n elements, by queries to subsets that return Yes if the subset contains some defecti...
Peter Damaschke, Azam Sheikh Muhammad
ITC
2003
IEEE
138views Hardware» more  ITC 2003»
15 years 11 months ago
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
Yannick Bonhomme, Patrick Girard, Loïs Guille...
ATS
2003
IEEE
84views Hardware» more  ATS 2003»
15 years 11 months ago
Test Time Minimization for Hybrid BIST of Core-Based Systems
Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, ...