5855 search results - page 28 / 1171 » Test generation and minimization with |
SOFSEM
2012
Springer
12 years 3 months ago
2012
Springer
The classical group testing problem asks to determine at most d defective elements in a set of n elements, by queries to subsets that return Yes if the subset contains some defecti...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
PASTE
2005
ACM
14 years 1 months ago
2005
ACM
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
