112 search results - page 10 / 23 » Test generation in VLSI circuits for crosstalk noise |
TODAES
2002
13 years 7 months ago
2002
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
CMOS Phase-locked loops (PLL) are ubiquitous in RF and mixed-signal integrated circuits. PLLs are very sensitive to noise fluctuations on the power and ground rails. In this paper...
DAC
1991
ACM
13 years 11 months ago
1991
ACM
REX is a program that extracts parasitic resistance and capacitance values for nodes in VLSI layouts. REX also performs network serial and parallel simplifications. Two types of n...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Two generations of a wideband low noise amplifier (LNA) employing noise canceling principle have been synthesized. The first generation design was fabricated in a 0.35 µm SiGe Bi...