112 search results - page 11 / 23 » Test generation in VLSI circuits for crosstalk noise |
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
EVOW
1999
Springer
13 years 12 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
DFT
2006
IEEE
13 years 9 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
VLSID
2002
IEEE
14 years 16 days ago
2002
IEEE
Power supply noise is a strong function of the switching activities of the circuit modules. Peak power supply noise can be significantly reduced by judiciously arranging the modu...