624 search results - page 2 / 125 » Test set compaction algorithms for combinational circuits |
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
ICCD
2003
IEEE
14 years 3 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
ICCAD
1991
IEEE
13 years 10 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ICCAD
1995
IEEE
13 years 10 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...