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» Testing Digital Circuits with Constraints
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CORR
2010
Springer
133views Education» more  CORR 2010»
13 years 8 months ago
Scalable, Time-Responsive, Digital, Energy-Efficient Molecular Circuits using DNA Strand Displacement
We propose a novel theoretical biomolecular design to implement any Boolean circuit using the mechanism of DNA strand displacement. The design is scalable: all species of DNA stra...
Ehsan Chiniforooshan, David Doty, Lila Kari, Shinn...
MJ
2007
119views more  MJ 2007»
13 years 8 months ago
Automated energy calculation and estimation for delay-insensitive digital circuits
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
Venkat Satagopan, Bonita Bhaskaran, Anshul Singh, ...
ISCAS
2007
IEEE
144views Hardware» more  ISCAS 2007»
14 years 2 months ago
A Fully Programmable Analog Window Comparator
— This paper presents a novel design of analog window comparator circuit. The comparator can adaptively adjust its error threshold according to the magnitude of input signal leve...
Rui Xiao, Amit Laknaur, Haibo Wang
VLSID
1997
IEEE
135views VLSI» more  VLSID 1997»
14 years 24 days ago
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...
ETS
2009
IEEE
99views Hardware» more  ETS 2009»
13 years 6 months ago
On Minimization of Peak Power for Scan Circuit during Test
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, ...