244 search results - page 33 / 49 » Testing Digital Circuits with Constraints |
ICCD
2008
IEEE
14 years 6 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
DATE
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
VLSID
2006
IEEE
14 years 10 months ago
2006
IEEE
: This paper presents a wideband frequency-shift keying (FSK) demodulator suitable for a digital data transmission chain of wireless neural stimulation microsystems such as cochlea...
ISLPED
1995
ACM
14 years 1 months ago
1995
ACM
We will present a power estimation technique for digital integrated circuits that operates at the register transfer level RTL . Such a high-level power estimation capability is r...
JCP
2007
13 years 9 months ago
2007
—This paper describes an Internet-based laboratory, named Remote Monitored and Controlled Laboratory (RMCLab) developed at University of Patras, Greece, for electrical engineerin...