1610 search results - page 10 / 322 » Testing Patterns |
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
IOLTS
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
IWANN
1995
Springer
14 years 1 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
VLSID
2003
IEEE
14 years 10 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ET
2000
13 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...