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ISCAS
1995
IEEE

95views Hardware» more ISCAS 1995»

A Self-Test Approach Using Accumulators as Test Pattern Generators

13 years 11 months ago

: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...

Albrecht P. Stroele

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24

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DAC
1999
ACM

129views Computer Architecture» more DAC 1999»

Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction

14 years 8 months ago

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz

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18

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DATE
2005
IEEE

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A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application

14 years 1 months ago

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— With increasing process ﬂuctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...

Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...

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26

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CORR
2011
Springer

151views Education» more CORR 2011»

A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register

13 years 2 months ago

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This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...

A. Ahmad

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19

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ISQED
2009
IEEE

135views Hardware» more ISQED 2009»

Simultaneous test pattern compaction, ordering and X-filling for testing power reduction

14 years 2 months ago