1610 search results - page 56 / 322 » Testing Patterns |
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
FLAIRS
2010
14 years 12 days ago
2010
We propose a generic framework that uses utility in decision making to drive the data mining process. We use concepts from meta-learning and build on earlier work by Elovici and B...
VTS
2008
IEEE
14 years 4 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...
ICCAD
1995
IEEE
14 years 1 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...