1610 search results - page 5 / 322 » Testing Patterns |
VTS
1996
IEEE
14 years 2 months ago
1996
IEEE
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
MCS
2011
Springer
13 years 4 months ago
2011
Springer
ICCAD
1994
IEEE
14 years 2 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...