1610 search results - page 8 / 322 » Testing Patterns |
COMPSAC
1999
IEEE
14 years 2 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
VTS
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
ICCAD
1991
IEEE
14 years 1 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
DFT
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...