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ICST
2009
IEEE
14 years 4 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
GI
2009
Springer
13 years 7 months ago
2009
Springer
: This contribution addresses systematic test development methods to include an algorithm to retrieve a test suite execution control in order to run test cases with high priority e...
DAC
1999
ACM
14 years 10 months ago
1999
ACM
DATE
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
ITC
1998
IEEE
14 years 2 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...