80 search results - page 12 / 16 » Testing embedded-core based system chips |
TVLSI
2008
13 years 6 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
BMCBI
2007
13 years 7 months ago
2007
Several systems have been presented in the last years in order to manage the complexity of large microarray experiments. Although good results have been achieved, most systems ten...
NOCS
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— The behaviour of systems on chip (SOC) is complex because they contain multiple processors that interact through concurrent interconnects, such as networks on chip (NOC...