225 search results - page 1 / 45 » The Design and Optimization of SOC Test Solutions |
ICCAD
2001
IEEE
14 years 3 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...
ET
2002
13 years 6 months ago
2002
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
VTS
2003
IEEE
14 years 2 days ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
DATE
2005
IEEE
14 years 13 days ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...