59 search results - page 4 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
DAC
2003
ACM
14 years 9 months ago
2003
ACM
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
HICSS
2007
IEEE
14 years 2 months ago
2007
IEEE
Web services technology has become a key technology for system integration and the implementation of service-oriented architectures. However, many organizations are still facing c...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...