Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jh...
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...
— More and more work in the field of artificial olfaction considers the integration of olfaction onto robotic systems. An important part of this integration is providing the ro...
—In this paper, the exact closed-form capacity expression for a hybrid selection/MIMO (H-S/MIMO) system in the spatial correlated Rayleigh fading channels is investigated. There ...