1960 search results - page 332 / 392 » The Logic of Large Enough |
ATS
2003
IEEE
14 years 2 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
System design methodology is poised to become the next big enabler for highly sophisticated electronic products. Design verification continues to be a major challenge and simulat...
IRI
2003
IEEE
14 years 2 months ago
2003
IEEE
– Building large software systems out of existing software components can save time and cost. These software components range from architectural and design components to binary c...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...