Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
We investigate coding techniques to reduce the energy consumed by on-chip buses in a microprocessor. We explore several simple coding schemes and simulate them using a modified Si...
Victor Wen, Mark Whitney, Yatish Patel, John Kubia...
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
The placement of passive components significantly influences the EMI behavior of power electronic systems. Particularly filter components are affected by magnetic field coupling r...