570 search results - page 90 / 114 » The behavior of resistive circuits |
ET
2010
13 years 7 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
HPCA
2004
IEEE
14 years 9 months ago
2004
IEEE
We investigate coding techniques to reduce the energy consumed by on-chip buses in a microprocessor. We explore several simple coding schemes and simulate them using a modified Si...
ICCD
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
The placement of passive components significantly influences the EMI behavior of power electronic systems. Particularly filter components are affected by magnetic field coupling r...