In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
Premkishore Shivakumar, Stephen W. Keckler, Charle...
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...
Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
— Clustering sensor nodes increases the scalability and energy efficiency of communications among them. In hostile environments, unexpected failures or attacks on cluster heads ...