42 search results - page 6 / 9 » Three-Dimensional Integrated Circuits: Performance, Design M... |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
ISQED
2003
IEEE
14 years 22 days ago
2003
IEEE
Approach Abstracts AltPSM Lithography Requirements for sub-100nm IC Design Domains Pradiptya Ghosh, Chung-shin Kang, Michael Sanie and David Pinto Numerical Technologies, 70 West P...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Traditional corner analysis fails to guarantee a target yield for a given performance metric. However, recently proposed solutions, in the form of statistical timing analysis, whi...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...