1476 search results - page 25 / 296 » Three-dimensional integrated circuits |
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
This paper presents a method to automatically generate posynomial response surface models for the performance parameters of analog integrated circuits. The posynomial models enabl...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
The prospective use of upcoming nanometer CMOS technology nodes (65nm, 45nm, and beyond) in bioelectronic interfaces is raising a number of important issues concerning circuit arc...
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
Abstract — The principles employed in the development of modern RF simulators are introduced and the various techniques currently in use, or expected to be in use in the next few...
3DIC
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...