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DATE
2007
IEEE
86views Hardware» more  DATE 2007»
14 years 2 months ago
Thermally robust clocking schemes for 3D integrated circuits
3D integration of multiple active layers into a single chip is a viable technique that greatly reduces the length of global wires by providing vertical connections between layers....
Mosin Mondal, Andrew J. Ricketts, Sami Kirolos, Ta...
DELTA
2002
IEEE
14 years 22 days ago
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...
ITC
1996
IEEE
78views Hardware» more  ITC 1996»
13 years 12 months ago
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits
common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
Michael J. Ohletz
ICCAD
2009
IEEE
144views Hardware» more  ICCAD 2009»
13 years 5 months ago
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton
ASPDAC
1998
ACM
101views Hardware» more  ASPDAC 1998»
14 years 3 hour ago
An Integrated Flow for Technology Remapping and Placement of Sub-half-micron Circuits
ABSTRACT - This paper presents a new design flow, FPDSiMPA, and a set of techniques for synthesizing high-performance sub-half micron logic circuits. FPD-SiMPA consists of logic p...
Jinan Lou, Amir H. Salek, Massoud Pedram