With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Placement migration is the movement of cells within an existing placement to address a variety of post-placement design closure issues, such as timing, routing congestion, signal ...
Haoxing Ren, David Zhigang Pan, Charles J. Alpert,...
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
Krishnan Ramakrishnan, S. Suresh, Narayanan Vijayk...
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
This paper presents new technology that accelerates system verification. Traditional methods for verifying functional designs are based on logic simulation, which becomes more tim...
Young-Il Kim, Woo-Seung Yang, Young-Su Kwon, Chong...