4306 search results - page 126 / 862 » Timed Testing with TorX |
ICML
2003
IEEE
14 years 11 months ago
2003
IEEE
This paper proposes a novel decision tree for a data set with time-series attributes. Our time-series tree has a value (i.e. a time sequence) of a time-series attribute in its int...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
BIOCOMP
2008
13 years 11 months ago
2008
In this paper we introduce a novel approach for the analysis of microarray titration experiments. The test introduced here can be used more generally for drug-dosage effect or time...
JMLR
2010
13 years 5 months ago
2010
A parametric version of herding is formulated. The nonlinear mapping between consecutive time slices is learned by a form of self-supervised training. The resulting dynamical syst...
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...