4306 search results - page 158 / 862 » Timed Testing with TorX |
MTV
2005
IEEE
14 years 3 months ago
2005
IEEE
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
ITC
2002
IEEE
14 years 3 months ago
2002
IEEE
Conventional fault simulation techniques for FPGAs are very complicated and time consuming. The other alternative, FPGA fault emulation technique, is incomplete, and can be used o...
ICRA
2010
IEEE
13 years 8 months ago
2010
IEEE
— We present here an original approach to test the feasibility of footsteps for a given walking pattern generator. It is based on a new approximation algorithm intended to cope w...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
FCT
2003
Springer
14 years 3 months ago
2003
Springer
We present an Extended Quadratic Frobenius Primality Test (EQFT), which is related to the Miller-Rabin test and to several other known probabilistic tests. EQFT takes time equival...