4306 search results - page 190 / 862 » Timed Testing with TorX |
SIGCSE
2004
ACM
14 years 4 months ago
2004
ACM
We present software tools that support robust input processing and comprehensive testing in Java. The software includes the JPT library that supports error-checked typed input via...
DFT
2000
IEEE
14 years 3 months ago
2000
IEEE
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
DFT
1999
IEEE
14 years 3 months ago
1999
IEEE
Fault identification capabilities are becoming increasingly important in modern designs, not only in support of design debugging methodologies, but also for the purpose of process...
ICCAD
2008
IEEE
14 years 7 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...