4306 search results - page 191 / 862 » Timed Testing with TorX |
ICSM
2009
IEEE
14 years 5 months ago
2009
IEEE
Many software systems rely on third-party components during their build process. Because the components are constantly evolving, quality assurance demands that developers perform ...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...