Many software systems rely on third-party components during their build process. Because the components are constantly evolving, quality assurance demands that developers perform ...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Aniru...
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...