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143
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DATE
2002
IEEE
15 years 9 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
128
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VTS
2003
IEEE
15 years 10 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
145
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ICCAD
1996
IEEE
15 years 9 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
130
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DFT
2003
IEEE
15 years 10 months ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
157
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FATES
2003
Springer
15 years 10 months ago
2003
Springer
Abstract. Writing specifications using Java Modeling Language has been accepted for a long time as a practical approach to increasing the correctness and quality of Java programs. ...