266 search results - page 5 / 54 » Timing yield estimation using statistical static timing anal... |
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
— Statistical static timing analysis deals with the increasing variations in manufacturing processes to reduce the pessimism in the worst case timing analysis. Because of the cor...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...