87 search results - page 17 / 18 » Transient Fault Detection in State-Automata |
IEEEPACT
2006
IEEE
14 years 3 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
We expect that in future commodity hardware will be used in safety critical applications. But the used commodity microprocessors will become less reliable because of decreasing fe...
DATE
2002
IEEE
14 years 2 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
ICNP
2000
IEEE
14 years 2 months ago
2000
IEEE
We present a protocol for maintaining multiple paths to each destination in a network of processes. For each destination, each process in the network maintains a set of neighbors ...
DSN
2002
IEEE
14 years 2 months ago
2002
IEEE
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...