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ITC
2003
IEEE
143views Hardware» more  ITC 2003»
14 years 2 months ago
Designed -in-diagnostics: A new optical method
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...
Keneth R. Wilsher
NANONET
2009
Springer
138views Chemistry» more  NANONET 2009»
14 years 1 months ago
Highly Sensitive Arrays of Nano-sized Single-Photon Avalanche Diodes for Industrial and Bio Imaging
In this paper we present a review of recent advances in the field of ultra-sensitive imagers with ultra fast detection capability. Photon counting capability in these sensors is ge...
Edoardo Charbon
TVLSI
1998
135views more  TVLSI 1998»
13 years 8 months ago
Wave-pipelining: a tutorial and research survey
— Wave-pipelining is a method of high-performance circuit design which implements pipelining in logic without the use of intermediate latches or registers. The combination of hig...
Wayne P. Burleson, Maciej J. Ciesielski, Fabian Kl...
DATE
2010
IEEE
123views Hardware» more  DATE 2010»
13 years 6 months ago
Accelerating Lightpath setup via broadcasting in binary-tree waveguide in Optical NoCs
In this paper, we propose a binary-tree waveguide connected Optical-Network-on-Chip (ONoC) to accelerate the establishment of the lightpath. By broadcasting the control data in the...
Binzhang Fu, Yinhe Han, Huawei Li, Xiaowei Li
DATE
2003
IEEE
96views Hardware» more  DATE 2003»
14 years 2 months ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...