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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
15 years 9 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
136
Voted
ACMSE
2006
ACM
15 years 8 months ago
Automatic support for testing web-based enterprise applications
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
Arturo Sanchez, Brandon Vega, Alexander Gonzalez, ...
118
Voted
EDM
2009
179views Data Mining» more  EDM 2009»
15 years 13 days ago
Learning Factors Transfer Analysis: Using Learning Curve Analysis to Automatically Generate Domain Models
This paper describes a novel method to create a quantitative model of an educational content domain of related practice item-types using learning curves. By using a pairwise test t...
Philip I. Pavlik Jr., Hao Cen, Kenneth R. Koedinge...
122
Voted
ICCAD
2009
IEEE
94views Hardware» more  ICCAD 2009»
15 years 11 days ago
Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. ...
128
Voted
ECBS
2008
IEEE
116views Hardware» more  ECBS 2008»
15 years 9 months ago
CiCUTS: Combining System Execution Modeling Tools with Continuous Integration Environments
System execution modeling (SEM) tools provide an effective means to evaluate the quality of service (QoS) of enterprise distributed real-time and embedded (DRE) systems. SEM tools...
James H. Hill, Douglas C. Schmidt, Adam A. Porter,...