865 search results - page 88 / 173 » Uncertainty Reduction Using Dynamics |
119
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VTS
2003
IEEE
15 years 7 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
110
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WCET
2008
15 years 4 months ago
2008
WCET analysis models for superscalar out-of-order CPUs generally need to be pessimistic in order to account for a wide range of possible dynamic behavior. CPU hardware modificatio...
119
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ISVLSI
2008
IEEE
15 years 9 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
139
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ISQED
2005
IEEE
15 years 8 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
115
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ICRA
2010
IEEE
15 years 1 months ago
2010
IEEE
— This paper presents a novel approach based on Jacobi shape theory and geometric reduction for formation control of autonomous underwater vehicles (AUVs). We consider a three de...