363 search results - page 35 / 73 » Validation coverage analysis for complex digital designs |
MTDT
2003
IEEE
14 years 1 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
DAC
2003
ACM
14 years 9 months ago
2003
ACM
This paper considers the role of performance and area estimates from behavioral synthesis in design space exploration. We have developed a compilation system that automatically ma...
ISLPED
2003
ACM
14 years 1 months ago
2003
ACM
Ever shrinking device sizes and innovative micro-architectural and circuit design techniques have made it possible to have multi-million transistor systems running at multi-gigahe...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
Given the increasing complexity of multi-processor systems-onchip, a wide range of parameters must be tuned to find the best trade-offs in terms of the selected system figures of ...
RECOMB
2004
Springer
14 years 9 months ago
2004
Springer
The challenge of similarity search in massive DNA sequence databases has inspired major changes in BLAST-style alignment tools, which accelerate search by inspecting only pairs of...