A feature of Formal Concept Analysis is the use of the line diagram of the concept lattice to visualize a conceptual space. The line diagram is a specialized form of Hasse diagram ...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
Robert Schwencker, Frank Schenkel, Michael Pronath...
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Internet traffic exhibits a rich autocorrelation behavior, responsible for curving the Energy/Averaging function. We show that the traffic exhibits variations of its details in ma...