— Leakage power dissipation becomes a dominant component in operation power in nanometer devices. This paper describes a design methodology to implement runtime power gating in a...
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
- Although the emerging three-dimensional integration technology can significantly reduce interconnect delay, chip area, and power dissipation in nanometer technologies, its impact...
Jason Cong, Ashok Jagannathan, Yuchun Ma, Glenn Re...
The design and implementation of a modern microprocessor creates many reliability challenges. Designers must verify the correctness of large complex systems and construct implemen...
Saugata Chatterjee, Christopher T. Weaver, Todd M....
This paper describes a low-power design methodology for a bus architecture based on hybrid current/voltage mode signaling for deep sub-micrometer on-chip interconnects that achiev...
Rizwan Bashirullah, Wentai Liu, Ralph K. Cavin III