1093 search results - page 101 / 219 » Verifying VLSI Circuits |
VLSID
2006
IEEE
14 years 11 months ago
2006
IEEE
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
VLSID
2001
IEEE
14 years 11 months ago
2001
IEEE
This paper presents novel techniques for the cycle-accurate power macro-modeling of complex RTL components. The proposed techniques are based on the observation that RTL component...
ISCAS
2006
IEEE
14 years 5 months ago
2006
IEEE
Abstract- Analog iterative decoders offer several advantages over their digital counterparts in terms of speed and power -A- log-MAP consumption. The current state of art CMOS anal...
VLSID
2007
IEEE
14 years 11 months ago
2007
IEEE
The robustness of engines for ATPG has to be improved to cope with the growing size of circuits. Recently, SAT-based ATPG approaches have been shown to be very robust even on larg...
ICCD
2004
IEEE
14 years 8 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...