1093 search results - page 137 / 219 » Verifying VLSI Circuits |
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
In the past, Field Programmable Gate Array (FPGA) circuits only contained a limited amount of logic and operated at a low frequency. Few applications running on FPGAs consumed exc...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
ICCAD
1995
IEEE
14 years 14 days ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...