1093 search results - page 72 / 219 » Verifying VLSI Circuits |
GLVLSI
2006
IEEE
14 years 4 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
ICCAD
1996
IEEE
14 years 2 months ago
1996
IEEE
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
GLVLSI
2009
IEEE
14 years 1 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
GLVLSI
2009
IEEE
14 years 1 months ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
GLVLSI
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper addresses a pipelined partial rolling (PPR) architecture for the AES encryption. The key technique is the PPR architecture, which is suitable for FPGA implementation. U...