42 search results - page 7 / 9 » Voltage Noise in Production Processors |
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Dive...
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
Designers are moving toward chip-multiprocessors (CMPs) to leverage application parallelism for higher performance while keeping design complexity under control. However, to date,...
CSE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Today’s wirelessly networked embedded systems underlie a vast array of electronic devices, performing computation, communication, and input/output. A major design goal...
ICPP
2008
IEEE
14 years 1 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...