85 search results - page 9 / 17 » Worst Cases and Lattice Reduction |
DDECS
2006
IEEE
14 years 1 months ago
2006
IEEE
- This paper presents a carry lookahead (CLA) circuitry design based on dynamic circuit aiming at delay reduction in addition of BCD coded decimal numbers. The performance of the p...
STOC
1989
ACM
13 years 11 months ago
1989
ACM
This paper takes the next step in developing the theory of average case complexity initiated by Leonid A Levin. Previous works Levin 84, Gurevich 87, Venkatesan and Levin 88] have...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
COCOON
1998
Springer
13 years 11 months ago
1998
Springer
In this paper, we generalize the Ski-Rental Problem to the Bahncard Problem which is an online problem of practical relevance for all travelers. The Bahncard is a railway pass of t...