Sciweavers

16 search results - page 1 / 4
» Wrapper Design for the Reuse of Networks-on-Chip as Test Acc...
Sort
View
ETS
2006
IEEE
113views Hardware» more  ETS 2006»
14 years 1 months ago
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
Alexandre M. Amory, Kees Goossens, Erik Jan Marini...
ET
2002
90views more  ET 2002»
13 years 7 months ago
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
DAC
2008
ACM
14 years 8 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
ITC
2000
IEEE
124views Hardware» more  ITC 2000»
13 years 12 months ago
Wrapper design for embedded core test
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
Yervant Zorian, Erik Jan Marinissen, Maurice Lousb...
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
13 years 7 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen