63 search results - page 7 / 13 » Wrapper design for embedded core test |
DAC
2000
ACM
14 years 8 months ago
2000
ACM
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
DAC
1999
ACM
13 years 11 months ago
1999
ACM
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC . The novel feature of the approach is the use an embedde...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
In System on Chip (SoC) design, growing design complexity has esigners to start designs at higher abstraction levels. This paper proposes an SoC design methodology that makes full...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...