36 search results - page 3 / 8 » dft 2003 |
ITC
2003
IEEE
13 years 12 months ago
2003
IEEE
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
ITC
2003
IEEE
13 years 12 months ago
2003
IEEE
In a carefully structured study spanning several months, the authors visited numerous companies focused on Design For Test methodologies in SoC Test, Characterization, and Failure...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
Safety-critical embedded systems often operate in harsh environmental conditions that necessitate fault-tolerant computing techniques. Many safety-critical systems also execute re...
DFT
2003
IEEE
13 years 12 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...